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Search result for:
characterization semiconductors
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Source title: Semiconductor Material and Device Characterization DIETER K. SCHRODER.pdf - 4shared.com - document sharing - download
- Location:
- 5 May 2012
- 21 May 2012
- 2
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12,44 Mb
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Source title: 4sharedsearch|semiconductor
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- 5 Dec 2010
- 24 Apr 2012
- 26
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12,44 Mb
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Semiconductor Material and Device Characterization Source title: Semiconductor Material and Device Characterization - Ebooks Free Download
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- 29 Apr 2011
- 15 May 2012
- 4
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8,78 Mb
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Source title: Semiconductor Process and Device Educational Links for Expert and Consulting Services
- Location:
- 10 Apr 2012
- 10 Apr 2012
- 0
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1,20 Mb
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Source title: Semiconductor Material and Device Characterization.pdf
- Location:
- 31 Mar 2012
- 13 May 2012
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Source title: Job Opportunities Sankalp Semiconductor Pvt. Ltd. – Analog and Mixed Signal Services and Solutions provider for Design, Layout and IO
- Location:
- 22 Mar 2012
- 27 Apr 2012
- 0
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69,42 Kb
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Source title: Packaging Technology National Semiconductor – Package Drawings, Part Marking, Package Codes, LLP, micro SMD, Micro-Array
- Location:
- 8 Mar 2012
- 17 Apr 2012
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78,54 Kb
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IBIS (Input/Output Buffer Information Specification) is a behavioral modeling specification for characterizing the inputs and outputs of integrated More
IBIS (Input/Output Buffer Information Specification) is a behavioral modeling specification for characterizing the inputs and outputs of integrated circuits. This 7-minute video shows how to use them in a signal integrity workflow. The ADS Transient-Convolution Simulator is used to determine the eye diagram and jitter decomposition from a schematic that includes IBIS models from two semiconductor companies (Xilinx and Micron in this example) joined with a channel model consisting of traces ... Hide
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STS 2010 由美商國家儀器首度舉辦,本論壇集合國內外知名專家與廠商,包含Tektronix、TERADYNE、Chroma、ON More
STS 2010 由美商國家儀器首度舉辦,本論壇集合國內外知名專家與廠商,包含Tektronix、TERADYNE、Chroma、ON Semiconductor、T2IS、宏相科技、思衞科技、凱茂科技、能高電子、凌陽創新科技、宗臣科技及國際半導體設備材料產業協會(SEMI)。主要針對半導體產業的驗證與測試做深入探討,從標準(Technical Standard) 的相容性測試(Compliance Test)、 IC 訊號的特性描述(Characterization) 或驗證(Verification and Validation)、測試系統的建立到RF 領域的半導體應用案例、現場量測(Field Test) 等,提供了各面向的探討與剖析,也建立了產業界彼此交流及學習技術的機會。 Hide
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Title: CHARACTERIZATION AND SIMULATION OF SEMICONDUCTOR DEVICES ELECTROSTATI\ C DISCHARGE PROTECTION IN MICROWAVE CIRCUIT APPLICATION Encryped: no Pages: 4 Source title: Solution Manual Physics of Semiconductor Devices SM Sze KK Ng - Download PDF Free - PDF files and E-book download Store
- Location:
- 27 May 2012
- 27 May 2012
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140,12 Kb
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Title: Growth process and characterization of magnetic semiconductors based on GeMn alloy films Author: BWeishaar Encryped: no Pages: 4 Source title: (1) www.xmnx movies.com - Web Search Results
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- 26 May 2012
- 26 May 2012
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184,86 Kb
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- 16 May 2012
- 16 May 2012
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2,25 Mb
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Author: Liza Porijo Encryped: no Pages: 1 Source title: Title matches "Photonic" - Universiti Teknologi Malaysia Institutional Repository
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- 16 May 2012
- 16 May 2012
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64,29 Kb
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Source title: Projetos CientÃficos
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- 13 May 2012
- 13 May 2012
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511,58 Kb
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Source title: Standards & Documents Search: JC-15: Thermal Characterization Techniques for Semiconductor Packages JEDEC
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- 17 May 2012
- 17 May 2012
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14,14 Mb
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Source title: Index of /~lomov/library/bigdvd/84/
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- 11 May 2012
- 11 May 2012
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12,44 Mb
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Source title: Index of /~lomov/library/bigdvd/77/
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- 11 May 2012
- 11 May 2012
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56,48 Mb
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Title: An On-Chip, Interconnect Capacitance Characterization Method With Sub-Fe\ mto-Farad Resolution - Semiconductor Manufacturing, IEEE Transactions on\ Author: IEEE Encryped: no Pages: 7 Source title: Index of /~hu/PUBLICATIONS/Hu_papers/Hu_Melvyl
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- 14 May 2012
- 14 May 2012
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158,86 Kb
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Title: AN1609 Author: Intersil Corporation Keywords: Intersil Corporation, semiconductors, Word Error Rate Measurement Methodology and Characterization Results Encryped: no Pages: 4 Source title: Data Converters: Analog Front Ends, Analog to Digital and Digital to Analog Conversion, Sample and Hold Amplifiers
- Location:
- 14 May 2012
- 14 May 2012
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117,21 Kb
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Source title: optical and electrical characterization of semiconductor nanostructures lecture 13 - Yahoo! Search Results
- Location:
- 12 May 2012
- 12 May 2012
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8,42 Mb
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- Location:
- 5 May 2012
- 5 May 2012
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3,00 Mb
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Source title: HANDBOOK OF INSTRUMENTATION AND TECHNIQUES FOR SEMICONDUCTOR NANOSTRUCTURE CHARACTERIZATION
- Location:
- 4 May 2012
- 4 May 2012
- 0
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8,68 Mb
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